| Study on Test Method for Storage Life Evaluate of Conductive Sealing Strip |
| Received:May 09, 2018 Revised:May 09, 2018 |
| DOI：10.12136/j.issn.1000-890X.2019.04.0311 |
| Key Words: conductive sealing strip；storage life；test evaluation；failure mechanism |
| Author Name | Affiliation | E-mail | | ZHANG Zhongwen* | The Fifth Institute of Electronics, Ministry of Industry and Information Technology
Guangdong Key Laboratory of Electronic Information Product Reliability Technology
National and Local Joint Engineering Center for Electronic Information Product Reliability Analysis and Testing Technology
Guangdong Province UAV Reliability and Safety Engineering Technology Research center | zhongwen22@126.com | | WANG Xuekong | The Fifth Institute of Electronics, Ministry of Industry and Information Technology
Guangdong Key Laboratory of Electronic Information Product Reliability Technology
National and Local Joint Engineering Center for Electronic Information Product Reliability Analysis and Testing Technology
Guangdong Province UAV Reliability and Safety Engineering Technology Research center | | | TANG Qingyun | The Fifth Institute of Electronics, Ministry of Industry and Information Technology
Guangdong Key Laboratory of Electronic Information Product Reliability Technology
National and Local Joint Engineering Center for Electronic Information Product Reliability Analysis and Testing Technology
Guangdong Province UAV Reliability and Safety Engineering Technology Research center | | | ZHONG Yunlong | The Fifth Institute of Electronics, Ministry of Industry and Information Technology
Guangdong Key Laboratory of Electronic Information Product Reliability Technology
National and Local Joint Engineering Center for Electronic Information Product Reliability Analysis and Testing Technology
Guangdong Province UAV Reliability and Safety Engineering Technology Research center | | | LIN Tingting | The Fifth Institute of Electronics, Ministry of Industry and Information Technology
Guangdong Key Laboratory of Electronic Information Product Reliability Technology
National and Local Joint Engineering Center for Electronic Information Product Reliability Analysis and Testing Technology
Guangdong Province UAV Reliability and Safety Engineering Technology Research center | |
|
| Hits: 1005 |
| Download times: 424 |
| Abstract: |
| The influence of storage environmental conditions and failure mechanism of the conductive sealing strip were analyzed， the typical environmental conditions of the storage period was determined. Taking the aging failure mechanism as the analysis object, and use a single temperature as the accelerated test condition to design a conductive.The storage accelerated life test method of the finished sealing strip can evaluate the storage life of the conductive sealing strip in a short period of time. The accelerated life test conditions of the conductive sealing strip stored for 10 years are determined as: temperature 100 ℃, relative humidity 5%, test time 28.3 d. |
|
View Full Text
View/Add Comment Download reader |
| Close |
