导电密封条贮存寿命评价试验方法研究

张钟文; 王学孔; 唐庆云; 钟云龙; 林婷婷

文章摘要

导电密封条贮存寿命评价试验方法研究

Study on Test Method for Storage Life Evaluate of Conductive Sealing Strip

投稿时间：2018-05-09 修订日期：2018-05-09

DOI：10.12136/j.issn.1000-890X.2019.04.0311

中文关键词: 导电密封条贮存寿命试验评价失效机理

英文关键词: conductive sealing strip storage life test evaluation failure mechanism

基金项目:国家电子信息产品可靠性与环境工程技术研究中心培育项目（2017B090903006）

作者	单位	E-mail
张钟文^*	工业和信息化部电子第五研究所；广东省电子信息产品可靠性技术重点实验室；电子信息产品可靠性分析与测试技术国家地方联合工程中心；广东省无人机可靠性与安全性工程技术研究中心	zhongwen22@126.com
王学孔	工业和信息化部电子第五研究所；广东省电子信息产品可靠性技术重点实验室；电子信息产品可靠性分析与测试技术国家地方联合工程中心；广东省无人机可靠性与安全性工程技术研究中心
唐庆云	工业和信息化部电子第五研究所；广东省电子信息产品可靠性技术重点实验室；电子信息产品可靠性分析与测试技术国家地方联合工程中心；广东省无人机可靠性与安全性工程技术研究中心
钟云龙	工业和信息化部电子第五研究所；广东省电子信息产品可靠性技术重点实验室；电子信息产品可靠性分析与测试技术国家地方联合工程中心；广东省无人机可靠性与安全性工程技术研究中心
林婷婷	工业和信息化部电子第五研究所；广东省电子信息产品可靠性技术重点实验室；电子信息产品可靠性分析与测试技术国家地方联合工程中心；广东省无人机可靠性与安全性工程技术研究中心

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中文摘要:

分析导电密封条的贮存环境条件影响及失效机理，确定贮存期的典型环境条件，以老化失效机理作为分析对象，基于时间-温度叠加的加速寿命预测模型，以单一温度为加速试验条件，设计导电密封条成品贮存加速寿命试验方法，可在较短的时间内评价导电密封条的贮存寿命。导电密封条贮存10年的加速寿命试验条件确定为：温度　100 ℃，相对湿度　5%，试验时间　28.3 d。

英文摘要:

The influence of storage environmental conditions and failure mechanism of the conductive sealing strip were analyzed， the typical environmental conditions of the storage period was determined. Taking the aging failure mechanism as the analysis object, and use a single temperature as the accelerated test condition to design a conductive.The storage accelerated life test method of the finished sealing strip can evaluate the storage life of the conductive sealing strip in a short period of time. The accelerated life test conditions of the conductive sealing strip stored for 10 years are determined as: temperature 100 ℃, relative humidity 5%, test time 28.3 d.

Author Name	Affiliation	E-mail
ZHANG Zhongwen	The Fifth Institute of Electronics, Ministry of Industry and Information Technology Guangdong Key Laboratory of Electronic Information Product Reliability Technology National and Local Joint Engineering Center for Electronic Information Product Reliability Analysis and Testing Technology Guangdong Province UAV Reliability and Safety Engineering Technology Research center	zhongwen22@126.com
WANG Xuekong	The Fifth Institute of Electronics, Ministry of Industry and Information Technology Guangdong Key Laboratory of Electronic Information Product Reliability Technology National and Local Joint Engineering Center for Electronic Information Product Reliability Analysis and Testing Technology Guangdong Province UAV Reliability and Safety Engineering Technology Research center
TANG Qingyun	The Fifth Institute of Electronics, Ministry of Industry and Information Technology Guangdong Key Laboratory of Electronic Information Product Reliability Technology National and Local Joint Engineering Center for Electronic Information Product Reliability Analysis and Testing Technology Guangdong Province UAV Reliability and Safety Engineering Technology Research center
ZHONG Yunlong	The Fifth Institute of Electronics, Ministry of Industry and Information Technology Guangdong Key Laboratory of Electronic Information Product Reliability Technology National and Local Joint Engineering Center for Electronic Information Product Reliability Analysis and Testing Technology Guangdong Province UAV Reliability and Safety Engineering Technology Research center
LIN Tingting	The Fifth Institute of Electronics, Ministry of Industry and Information Technology Guangdong Key Laboratory of Electronic Information Product Reliability Technology National and Local Joint Engineering Center for Electronic Information Product Reliability Analysis and Testing Technology Guangdong Province UAV Reliability and Safety Engineering Technology Research center

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